| 7.1 Insulation Resistance | Unmated connectors, apply 100Volts DC between adjacent contacts and contacts and ground. | EIA 364-21C | 100M minimum (unmated) |
| 7.2 Low Level Contact Resistance | 100mA max., 20mV Max. open circuit at 100mA Max. | EIA 364-23b | 40m (Max) initial for VBUS and GND contacts and all other contacts; delta Max. 10m (Max) after test |
| 7.3 Dielectric Withstanding Voltage | Subjected to 100VAC (RMS) for 1 minute between adjacent terminals. | EIA 364-20 | There shall be no breakdown |
| 7.4 Contact Current Rating | 5.0A shall be applied collectively to VBUS pins and 1.25 A applied to the VCONN pin and 0.25 A the other contacts. | EIA364-70 | When the currents are applied to the contacts, the temperature rise shall not exceed 30 C at any point on the USB Type-C mated plug and receptacle under test, when measured at an ambient temperature of 25 C. |
| Cable Durability | Must meet the following criteria after the cycle test is completed: | EIA 364-09 | - Contact resistance (40m > delta 10m (Max) after test)
- Insertion force (5N to 20N)
- Extraction force (8N to 20N)
- Visual inspection (no exposed base metal on contacts) |
| Cable Flexing | No discontinuity over 1 microsecond During flexing or physical damage allowed | EIA 364-41 | 100 cycles in each of 2 planes 120 degree. Dimension x=3.7x cable diameter |
| Cable Pull-Out | No discontinuity or physical damage allowed | EIA-364-38 | 40N steady state axial load for 1 minute |
| 4-axes continuity test | No discontinuity greater than 1s and no physical damage to the specimen (one cable per test) | EIA364-18 | 8N tensile force for a period of 10 seconds Min; The specimen must subject to 0, 90, 180, 270 direction. |
| 8.1 Temperature Life | 105 C without applied voltage for 120 hours. 105 C without applied voltage for 72 hours when used as preconditioning in EIA 364-1000.01. Visual inspection, Test shall be done in sequences defined in EIA 364-1000.01. | EIA 364-17 | 105C for 120 hours. |
| 8.2 Thermal Shock | There shall be no evidence of any physical damage. | EIA 364-32 | 10 Cycles -55C and +85C. The USB 3.0 connectors under test must be mated. |
| 8.3 Salt Spray | 1).Shall meet visual requirement, show no physical damage.
2).Shall meet requirements of additional tests as specified in test sequence in Section 5 | MIL-STD-202F, Method 101D, Test Condition B | Subject mated connectors to 48 hours at 35C with 5% Salt-solution concentration. |
